Ultrahigh-sensitivity high-linearity photodetection system using a low-gain avalanche photodiode with an ultralow-noise readout circuit
Optics Letters, Vol. 30, Issue 2, pp. 123-125 (2005)
http://dx.doi.org/10.1364/OL.30.000123
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Abstract
A highly sensitive photodetection system with a detection limit of 1 photon/s was developed. This system uses a commercially available 200-µm-diameter silicon avalanche photodiode (APD) and an in-house-developed ultralow-noise readout circuit, which are both cooled to 77K. When the APD operates at a low gain of ∼10, it has a high-linearity response to the number of incident photons and a low excess noise factor. The APD also has a high quantum efficiency and a dark current of less than 1e/s at 77K. This photodetection system will shorten measurement time and permit higher spatial and wavelength resolution for near-field scanning optical microscopes.
© 2005 Optical Society of America
OCIS Codes
(040.3060) Detectors : Infrared
(040.3780) Detectors : Low light level
(040.5160) Detectors : Photodetectors
(040.5350) Detectors : Photovoltaic
(040.6040) Detectors : Silicon
(040.6070) Detectors : Solid state detectors
Citation
Makoto Akiba, Mikio Fujiwara, and Masahide Sasaki, "Ultrahigh-sensitivity high-linearity photodetection system using a low-gain avalanche photodiode with an ultralow-noise readout circuit," Opt. Lett. 30, 123-125 (2005)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-30-2-123
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