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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Anthony J. Campillo
  • Vol. 30, Iss. 20 — Oct. 15, 2005
  • pp: 2718–2720

Optical edge-projection method for three-dimensional profilometry

C. J. Tay, H. Miao, and Y. Fu  »View Author Affiliations


Optics Letters, Vol. 30, Issue 20, pp. 2718-2720 (2005)
http://dx.doi.org/10.1364/OL.30.002718


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Abstract

A novel optical edge-projection method is proposed for surface contouring of an object with low reflectivity. A structured light edge is projected onto a dark surface, and the image is captured by a CCD camera. The object contour is evaluated with an active triangular projection algorithm, and one obtains a whole-field three-dimensional contour of the object by scanning the optical edge over the entire object surface. The proposed method is applied to a black nonreflective object made from woven carbon fiber and is also applied to measure the profile of a small object (a coin). The results show that an accurate profile of the specimen can be obtained.

© 2005 Optical Society of America

OCIS Codes
(100.2650) Image processing : Fringe analysis
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure

ToC Category:
Instrumentation, Measurement, and Metrology

Citation
C. J. Tay, H. Miao, and Y. Fu, "Optical edge-projection method for three-dimensional profilometry," Opt. Lett. 30, 2718-2720 (2005)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-30-20-2718


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