Abstract

It is demonstrated that ultrahigh-resolution angular measurement can be achieved via surface-plasmon-resonance excitation in which the phase difference between p- and s-polarized reflected waves is monitored as a function of the incidence angle. Resolutions down to $1.9\times {10}^{-6}\mathrm{deg}$ are obtained by performing the measurements at optimal incident wavelengths. This represents an order of magnitude improvement compared with previously reported values.

© 2005 Optical Society of America

Angular-interrogation attenuated total reflection metrology system for plasmonic sensors

Jenq-Nan Yih, Fan-Ching Chien, Chun-Yun Lin, Hon-Fai Yau, and Shean-Jen Chen
Appl. Opt. 44(29) 6155-6162 (2005)

Dual-mode surface-plasmon-resonance sensors using angular interrogation

Jing Guo, P. Donald Keathley, and J. T. Hastings
Opt. Lett. 33(5) 512-514 (2008)

Common-path phase-shift interferometry surface plasmon resonance imaging system

Y.-D. Su, S.-J. Chen, and T.-L. Yeh
Opt. Lett. 30(12) 1488-1490 (2005)

High-resolution surface plasmon resonance sensor based on linewidth-optimized nanohole array transmittance

Kevin A. Tetz, Lin Pang, and Yeshaiahu Fainman
Opt. Lett. 31(10) 1528-1530 (2006)

Resolution enhancement of surface plasmon resonance sensors with spectral interrogation: resonant wavelength considerations

Zhenling Chen, Le Liu, Yonghong He, and Hui Ma
Appl. Opt. 55(4) 884-891 (2016)