High-resolution angular measurement using surface-plasmon-resonance via phase interrogation at optimal incident wavelengths
Optics Letters, Vol. 30, Issue 20, pp. 2727-2729 (2005)
http://dx.doi.org/10.1364/OL.30.002727
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Abstract
It is demonstrated that ultrahigh-resolution angular measurement can be achieved via surface-plasmon-resonance excitation in which the phase difference between p- and s-polarized reflected waves is monitored as a function of the incidence angle. Resolutions down to 1.9×10^−6 deg are obtained by performing the measurements at optimal incident wavelengths. This represents an order of magnitude improvement compared with previously reported values.
© 2005 Optical Society of America
OCIS Codes
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(240.6680) Optics at surfaces : Surface plasmons
ToC Category:
Instrumentation, Measurement, and Metrology
Citation
Hai-Pang Chiang, Jing-Lun Lin, Railing Chang, Sheng-Yu Su, and Pui Tak Leung, "High-resolution angular measurement using surface-plasmon-resonance via phase interrogation at optimal incident wavelengths," Opt. Lett. 30, 2727-2729 (2005)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-30-20-2727
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