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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Anthony J. Campillo
  • Vol. 30, Iss. 20 — Oct. 15, 2005
  • pp: 2727–2729

High-resolution angular measurement using surface-plasmon-resonance via phase interrogation at optimal incident wavelengths

Hai-Pang Chiang, Jing-Lun Lin, Railing Chang, Sheng-Yu Su, and Pui Tak Leung  »View Author Affiliations


Optics Letters, Vol. 30, Issue 20, pp. 2727-2729 (2005)
http://dx.doi.org/10.1364/OL.30.002727


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Abstract

It is demonstrated that ultrahigh-resolution angular measurement can be achieved via surface-plasmon-resonance excitation in which the phase difference between p- and s-polarized reflected waves is monitored as a function of the incidence angle. Resolutions down to 1.9×10^−6 deg are obtained by performing the measurements at optimal incident wavelengths. This represents an order of magnitude improvement compared with previously reported values.

© 2005 Optical Society of America

OCIS Codes
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(240.6680) Optics at surfaces : Surface plasmons

ToC Category:
Instrumentation, Measurement, and Metrology

Citation
Hai-Pang Chiang, Jing-Lun Lin, Railing Chang, Sheng-Yu Su, and Pui Tak Leung, "High-resolution angular measurement using surface-plasmon-resonance via phase interrogation at optimal incident wavelengths," Opt. Lett. 30, 2727-2729 (2005)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-30-20-2727

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