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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Anthony J. Campillo
  • Vol. 30, Iss. 20 — Oct. 15, 2005
  • pp: 2739–2741

Integrated-optic variable delay line and its application to a low-coherence reflectometer

K. Takiguchi, M. Itoh, and H. Takahashi  »View Author Affiliations


Optics Letters, Vol. 30, Issue 20, pp. 2739-2741 (2005)
http://dx.doi.org/10.1364/OL.30.002739


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Abstract

We propose a large-scale variable delay line based on planar light-wave circuit technology and its application as a reference arm in an optical low-coherence reflectometer. This variable delay line is composed of 16 asymmetrical delay arm pairs sandwiched between 2 optical switches, which select the path for a needed delay. This configuration enables us to eliminate the need for a moving part in the reflectometer. We can scan the reference arm over a length of 262.1 mm with a step of less than 1.0 µm in air and achieve reflectometer sensitivity of about −47 dB.

© 2005 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(130.3120) Integrated optics : Integrated optics devices
(130.6010) Integrated optics : Sensors
(230.7390) Optical devices : Waveguides, planar

ToC Category:
Integrated Optics

Citation
K. Takiguchi, M. Itoh, and H. Takahashi, "Integrated-optic variable delay line and its application to a low-coherence reflectometer," Opt. Lett. 30, 2739-2741 (2005)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-30-20-2739

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