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Optics Letters

Optics Letters


  • Editor: Anthony J. Campillo
  • Vol. 30, Iss. 21 — Nov. 1, 2005
  • pp: 2873–2875

Determination of curvature and twist by digital shearography and wavelet transforms

Cho Jui Tay and Yu Fu  »View Author Affiliations

Optics Letters, Vol. 30, Issue 21, pp. 2873-2875 (2005)

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A new technique based on digital shearography for determining the transient curvature and twist of a continuously deforming object from a series of speckle patterns is presented. The intensity variation of each pixel is analyzed along the time axis by using a complex Morlet wavelet transform. The absolute sign of the phase variation is determined by introduction of a temporal carrier when the speckle patterns are captured by a high-speed camera. A high-quality spatial distribution of the deflection derivative is extracted at any instant without the need for temporal or spatial phase unwrapping. The continuous Haar wavelet transform is subsequently processed as a differentiation operator to reconstruct the instantaneous curvature and twist of a continuously deforming object.

© 2005 Optical Society of America

OCIS Codes
(100.7410) Image processing : Wavelets
(110.6150) Imaging systems : Speckle imaging
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.6160) Instrumentation, measurement, and metrology : Speckle interferometry

ToC Category:

Cho Jui Tay and Yu Fu, "Determination of curvature and twist by digital shearography and wavelet transforms," Opt. Lett. 30, 2873-2875 (2005)

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