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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Anthony J. Campillo
  • Vol. 30, Iss. 21 — Nov. 1, 2005
  • pp: 2879–2881

Double-pass axially resolved confocal Mueller matrix imaging polarimetry

David Lara and Chris Dainty  »View Author Affiliations


Optics Letters, Vol. 30, Issue 21, pp. 2879-2881 (2005)
http://dx.doi.org/10.1364/OL.30.002879


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Abstract

We present experimental depth-resolved complete polarization-sensitive measurements of a stack of linear retarders and glass plates by using what is to the best of our knowledge the first combination of a confocal imaging system with a complete Mueller matrix polarimeter. The axially resolved Mueller matrices were compared with a forward simulation, with good agreement.

© 2005 Optical Society of America

OCIS Codes
(110.6880) Imaging systems : Three-dimensional image acquisition
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(180.1790) Microscopy : Confocal microscopy

ToC Category:
Imaging Systems

Citation
David Lara and Chris Dainty, "Double-pass axially resolved confocal Mueller matrix imaging polarimetry," Opt. Lett. 30, 2879-2881 (2005)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-30-21-2879

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