We present experimental depth-resolved complete polarization-sensitive measurements of a stack of linear retarders and glass plates by using what is to the best of our knowledge the first combination of a confocal imaging system with a complete Mueller matrix polarimeter. The axially resolved Mueller matrices were compared with a forward simulation, with good agreement.
© 2005 Optical Society of America
(110.6880) Imaging systems : Three-dimensional image acquisition
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(180.1790) Microscopy : Confocal microscopy
David Lara and Chris Dainty, "Double-pass axially resolved confocal Mueller matrix imaging polarimetry," Opt. Lett. 30, 2879-2881 (2005)