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Optics Letters

Optics Letters


  • Editor: Anthony J. Campillo
  • Vol. 30, Iss. 21 — Nov. 1, 2005
  • pp: 2879–2881

Double-pass axially resolved confocal Mueller matrix imaging polarimetry

David Lara and Chris Dainty  »View Author Affiliations

Optics Letters, Vol. 30, Issue 21, pp. 2879-2881 (2005)

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We present experimental depth-resolved complete polarization-sensitive measurements of a stack of linear retarders and glass plates by using what is to the best of our knowledge the first combination of a confocal imaging system with a complete Mueller matrix polarimeter. The axially resolved Mueller matrices were compared with a forward simulation, with good agreement.

© 2005 Optical Society of America

OCIS Codes
(110.6880) Imaging systems : Three-dimensional image acquisition
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(180.1790) Microscopy : Confocal microscopy

ToC Category:
Imaging Systems

David Lara and Chris Dainty, "Double-pass axially resolved confocal Mueller matrix imaging polarimetry," Opt. Lett. 30, 2879-2881 (2005)

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  1. J. F. de Boer and T. E. Milner, J. Biomed. Opt.  7, 359 (2002). [CrossRef]
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  5. D. Lara and C. Dainty, “Axially resolved complete polarization sensitive imaging with a confocal Mueller matrix imaging polarimeter,” Appl. Opt.
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