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Optics Letters

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  • Vol. 30, Iss. 8 — Apr. 15, 2005
  • pp: 866–868

Characterization of a second-order nonlinear layer profile in thermally poled optical fibers with second-harmonic microscopy

Honglin An and Simon Fleming  »View Author Affiliations


Optics Letters, Vol. 30, Issue 8, pp. 866-868 (2005)
http://dx.doi.org/10.1364/OL.30.000866


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Abstract

Second-harmonic microscopy has been successfully applied to characterize the second-order nonlinear layer in optical fibers thermally poled at 280 °C and 3.5 kV for 30 min. The nonlinear layer was found to be ∼5.1 µm deep under the anode and was not always centered about the closest point between the electrodes.

© 2005 Optical Society of America

OCIS Codes
(160.4330) Materials : Nonlinear optical materials
(160.6030) Materials : Silica
(190.1900) Nonlinear optics : Diagnostic applications of nonlinear optics
(190.4160) Nonlinear optics : Multiharmonic generation

Citation
Honglin An and Simon Fleming, "Characterization of a second-order nonlinear layer profile in thermally poled optical fibers with second-harmonic microscopy," Opt. Lett. 30, 866-868 (2005)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-30-8-866


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