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Optics Letters

Optics Letters

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  • Vol. 30, Iss. 8 — Apr. 15, 2005
  • pp: 899–901

Opposite Goos-Hänchen shifts for transverse-electric and transverse-magnetic beams at the interface associated with single-negative materials

Xiaolong Hu, Yidong Huang, Wei Zhang, De-Kui Qing, and Jiangde Peng  »View Author Affiliations


Optics Letters, Vol. 30, Issue 8, pp. 899-901 (2005)
http://dx.doi.org/10.1364/OL.30.000899


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Abstract

Goos-Hänchen shifts are investigated when total reflection occurs at the interfaces associated with single-negative materials (SNMs). A general rule for judging the direction of the Goos-Hänchen lateral shift concerning lossless media is obtained: Whether the lateral shift is positive or negative depends on the sign of µ1µ2 for TE-polarized incident beams and varepsilon_1 varepsilon_2 for TM-polarized incident beams. It was theoretically demonstrated that, at the interface associated with SNMs, TE- and TM-polarized incident beams experience opposite Goos-Hänchen lateral shifts. An effective and simple approach to discriminating varepsilon-negative material and µ-negative material is proposed.

© 2005 Optical Society of America

OCIS Codes
(260.5430) Physical optics : Polarization
(260.6970) Physical optics : Total internal reflection

Citation
Xiaolong Hu, Yidong Huang, Wei Zhang, De-Kui Qing, and Jiangde Peng, "Opposite Goos-Hänchen shifts for transverse-electric and transverse-magnetic beams at the interface associated with single-negative materials," Opt. Lett. 30, 899-901 (2005)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-30-8-899

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