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  • Vol. 30, Iss. 9 — May. 1, 2005
  • pp: 1000–1002

Linewidth and relative intensity noise measurements of longitudinal modes in ultrahigh-speed mode-locked laser diodes

Kentaro Haneda, Masato Yoshida, Masataka Nakazawa, Hiroyuki Yokoyama, and Yoh Ogawa  »View Author Affiliations


Optics Letters, Vol. 30, Issue 9, pp. 1000-1002 (2005)
http://dx.doi.org/10.1364/OL.30.001000


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Abstract

The longitudinal linewidth and corresponding relative intensity noise (RIN) of 10- and 40-GHz mode-locked laser diodes are measured for the first time to our knowledge. It is shown that the cavity Q value is a dominant parameter of the linewidth. It is also shown that the linewidth of the individual modes is almost constant. This means that the phase noise of each mode is almost the same in the mode-locked condition. The RIN value is larger for modes that are distant from the center longitudinal mode. This mode dependence is a consequence of the mode partition noise.

© 2005 Optical Society of America

OCIS Codes
(140.4050) Lasers and laser optics : Mode-locked lasers
(140.5960) Lasers and laser optics : Semiconductor lasers

Citation
Kentaro Haneda, Masato Yoshida, Masataka Nakazawa, Hiroyuki Yokoyama, and Yoh Ogawa, "Linewidth and relative intensity noise measurements of longitudinal modes in ultrahigh-speed mode-locked laser diodes," Opt. Lett. 30, 1000-1002 (2005)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-30-9-1000


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