We present a new method for measuring the spectral phase of ultrashort pulses that utilizes spectral shearing interferometry with zero delay. Unlike conventional spectral phase interferometry for direct electric-field reconstruction, which encodes phase as a sensitively calibrated fringe in the spectral domain, two-dimensional spectral shearing interferometry robustly encodes phase along a second dimension. This greatly reduces demands on the spectrometer and allows for complex phase spectra to be measured over extremely large bandwidths, potentially exceeding 1.5 octaves.
© 2006 Optical Society of America
Original Manuscript: March 7, 2006
Revised Manuscript: April 11, 2006
Manuscript Accepted: April 13, 2006
Jonathan R. Birge, Richard Ell, and Franz X. Kärtner, "Two-dimensional spectral shearing interferometry for few-cycle pulse characterization," Opt. Lett. 31, 2063-2065 (2006)