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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Anthony J. Campillo
  • Vol. 31, Iss. 13 — Jul. 1, 2006
  • pp: 2063–2065

Two-dimensional spectral shearing interferometry for few-cycle pulse characterization

Jonathan R. Birge, Richard Ell, and Franz X. Kärtner  »View Author Affiliations


Optics Letters, Vol. 31, Issue 13, pp. 2063-2065 (2006)
http://dx.doi.org/10.1364/OL.31.002063


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Abstract

We present a new method for measuring the spectral phase of ultrashort pulses that utilizes spectral shearing interferometry with zero delay. Unlike conventional spectral phase interferometry for direct electric-field reconstruction, which encodes phase as a sensitively calibrated fringe in the spectral domain, two-dimensional spectral shearing interferometry robustly encodes phase along a second dimension. This greatly reduces demands on the spectrometer and allows for complex phase spectra to be measured over extremely large bandwidths, potentially exceeding 1.5 octaves.

© 2006 Optical Society of America

OCIS Codes
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(320.7100) Ultrafast optics : Ultrafast measurements

ToC Category:
Ultrafast Optics

History
Original Manuscript: March 7, 2006
Revised Manuscript: April 11, 2006
Manuscript Accepted: April 13, 2006

Citation
Jonathan R. Birge, Richard Ell, and Franz X. Kärtner, "Two-dimensional spectral shearing interferometry for few-cycle pulse characterization," Opt. Lett. 31, 2063-2065 (2006)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-31-13-2063

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