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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Anthony J. Campillo
  • Vol. 31, Iss. 14 — Jul. 15, 2006
  • pp: 2130–2132

Subwavelength imaging with a multilayer silver film structure

K. J. Webb and M. Yang  »View Author Affiliations


Optics Letters, Vol. 31, Issue 14, pp. 2130-2132 (2006)
http://dx.doi.org/10.1364/OL.31.002130


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Abstract

A Ag Si O 2 multilayer imaging structure is shown to have subwavelength performance. Loss is the major limitation, and selection of low-loss materials and suitable operating wavelengths has a significant impact on performance. The influence of the variables is presented, and vortices are shown to exist.

© 2006 Optical Society of America

OCIS Codes
(110.2990) Imaging systems : Image formation theory
(160.4670) Materials : Optical materials
(260.3910) Physical optics : Metal optics
(310.6860) Thin films : Thin films, optical properties

ToC Category:
Imaging Systems

History
Original Manuscript: February 28, 2006
Revised Manuscript: April 5, 2006

Citation
K. J. Webb and M. Yang, "Subwavelength imaging with a multilayer silver film structure," Opt. Lett. 31, 2130-2132 (2006)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-31-14-2130

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