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Optics Letters

Optics Letters


  • Editor: Anthony J. Campillo
  • Vol. 31, Iss. 16 — Aug. 15, 2006
  • pp: 2393–2395

Probing optical microfiber nonuniformities at nanoscale

M. Sumetsky, Y. Dulashko, J. M. Fini, A. Hale, and J. W. Nicholson  »View Author Affiliations

Optics Letters, Vol. 31, Issue 16, pp. 2393-2395 (2006)

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We demonstrate a novel, simple, and comprehensive method for probing optical microfiber surface and bulk distortions with subnanometer accuracy. The method employs a regular optical fiber as a probe that slides along a microfiber transmitting the fundamental mode. The fraction of radiation power absorbed in the probe depends on the local distribution of the mode propagating in the microfiber. From the measured variation of the absorbed power, we determine the variation of the effective microfiber radius, which takes into account both the microfiber radius and refractive index variations. Furthermore, we verify the cylindrical symmetry of the microfiber nonuniformities by probing the microfiber from different sides. These results explain observed transmission losses in silica microfibers and open broad opportunities for microfiber investigation.

© 2006 Optical Society of America

OCIS Codes
(060.2340) Fiber optics and optical communications : Fiber optics components
(060.2370) Fiber optics and optical communications : Fiber optics sensors

ToC Category:
Fiber Optics and Optical Communications

Original Manuscript: May 2, 2006
Revised Manuscript: May 24, 2006
Manuscript Accepted: June 2, 2006
Published: July 25, 2006

M. Sumetsky, Y. Dulashko, J. M. Fini, A. Hale, and J. W. Nicholson, "Probing optical microfiber nonuniformities at nanoscale," Opt. Lett. 31, 2393-2395 (2006)

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