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Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Anthony J. Campillo
  • Vol. 31, Iss. 16 — Aug. 15, 2006
  • pp: 2450–2452

Extended focus depth for Fourier domain optical coherence microscopy

R. A. Leitgeb, M. Villiger, A. H. Bachmann, L. Steinmann, and T. Lasser  »View Author Affiliations


Optics Letters, Vol. 31, Issue 16, pp. 2450-2452 (2006)
http://dx.doi.org/10.1364/OL.31.002450


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Abstract

We report on a new detection scheme for Fourier domain optical coherence microscopy that exhibits high transverse resolution along an axially extended focal range. Nearly constant transverse resolution of 1.5 μ m along a focal range of 200 μ m is experimentally verified with a maximum sensitivity of 105 dB . A broad-bandwidth Ti:sapphire laser allowed for an axial resolution of 3 μ m in air.

© 2006 Optical Society of America

OCIS Codes
(110.4500) Imaging systems : Optical coherence tomography
(170.3880) Medical optics and biotechnology : Medical and biological imaging
(170.6900) Medical optics and biotechnology : Three-dimensional microscopy

ToC Category:
Medical Optics and Biotechnology

History
Original Manuscript: April 4, 2006
Revised Manuscript: May 24, 2006
Manuscript Accepted: May 29, 2006
Published: July 25, 2006

Virtual Issues
Vol. 1, Iss. 9 Virtual Journal for Biomedical Optics

Citation
R. A. Leitgeb, M. Villiger, A. H. Bachmann, L. Steinmann, and T. Lasser, "Extended focus depth for Fourier domain optical coherence microscopy," Opt. Lett. 31, 2450-2452 (2006)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-31-16-2450


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