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Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Anthony J. Campillo
  • Vol. 31, Iss. 20 — Oct. 15, 2006
  • pp: 3037–3039

Characterization of frequency-tripled nanosecond pulsed Ti:sapphire laser injection seeded by a frequency-scanning cw Ti:sapphire laser by use of optogalvanic spectroscopy of silicon atoms

Yasutomo Shiomi, Kuniaki Kyutoku, Hiroshi Kumagai, and Ataru Kobayashi  »View Author Affiliations


Optics Letters, Vol. 31, Issue 20, pp. 3037-3039 (2006)
http://dx.doi.org/10.1364/OL.31.003037


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Abstract

The performance of a narrow-linewidth nanosecond pulsed deep-UV coherent light source consisting of a frequency-tripled nanosecond pulsed Ti:sapphire laser injection seeded by a frequency-scanning cw Ti:sapphire laser has been characterized by using optogalvanic spectroscopy of silicon atoms as a diagnostic. The envelope of the optogalvanic spectrum indicates the pure Doppler broadening of silicon atoms, which was estimated to be as broad as 4 GHz , without the broadening effect from the laser linewidth itself.

© 2006 Optical Society of America

OCIS Codes
(140.3520) Lasers and laser optics : Lasers, injection-locked
(300.6440) Spectroscopy : Spectroscopy, optogalvanic

ToC Category:
Spectroscopy

History
Original Manuscript: June 28, 2006
Revised Manuscript: July 25, 2006
Manuscript Accepted: July 25, 2006
Published: September 25, 2006

Citation
Yasutomo Shiomi, Kuniaki Kyutoku, Hiroshi Kumagai, and Ataru Kobayashi, "Characterization of frequency-tripled nanosecond pulsed Ti:sapphire laser injection seeded by a frequency-scanning cw Ti:sapphire laser by use of optogalvanic spectroscopy of silicon atoms," Opt. Lett. 31, 3037-3039 (2006)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-31-20-3037


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References

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