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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Anthony J. Campillo
  • Vol. 31, Iss. 23 — Dec. 1, 2006
  • pp: 3444–3446

Generalized Yamaguchi correlation factor for coherent quadratic phase speckle metrology systems with an aperture

Damien P. Kelly, Jennifer E. Ward, Unnikrishnan Gopinathan, Bryan M. Hennelly, Feidhlim T. O’Neill, and John T. Sheridan  »View Author Affiliations


Optics Letters, Vol. 31, Issue 23, pp. 3444-3446 (2006)
http://dx.doi.org/10.1364/OL.31.003444


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Abstract

In speckle-based metrology systems, a finite range of possible motion or deformation can be measured. When coherent imaging systems with a single limiting aperture are used in speckle metrology, the observed de correlation effects that ultimately define this range are described by the well-known Yamaguchi correlation factor. We extend this result to all coherent quadratic phase paraxial optical systems with a single aperture and provide experimental results to support our theoretical conclusions.

© 2006 Optical Society of America

OCIS Codes
(070.0070) Fourier optics and signal processing : Fourier optics and signal processing
(070.6020) Fourier optics and signal processing : Continuous optical signal processing
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.6150) Instrumentation, measurement, and metrology : Speckle imaging

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: June 20, 2006
Manuscript Accepted: July 26, 2006
Published: November 9, 2006

Citation
Damien P. Kelly, Jennifer E. Ward, Unnikrishnan Gopinathan, Bryan M. Hennelly, Feidhlim T. O'Neill, and John T. Sheridan, "Generalized Yamaguchi correlation factor for coherent quadratic phase speckle metrology systems with an aperture," Opt. Lett. 31, 3444-3446 (2006)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-31-23-3444

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