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Optics Letters

Optics Letters


  • Editor: Anthony J. Campillo
  • Vol. 31, Iss. 23 — Dec. 1, 2006
  • pp: 3523–3525

Highly sensitive, single-shot characterization for pulse widths from 0.4 to 85 ps using electro-optic shearing interferometry

J. Bromage, C. Dorrer, I. A. Begishev, N. G. Usechak, and J. D. Zuegel  »View Author Affiliations

Optics Letters, Vol. 31, Issue 23, pp. 3523-3525 (2006)

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Single-shot characterization using electro-optic shearing interferometry (EOSI) is shown for pulse widths ranging from their transform limit ( 0.4 ps ) to 200 × their limit ( 85 ps ) . In EOSI, the spectral phase is reconstructed by interfering two spectrally sheared replicas of the pulse under test, where the shear is produced by applying linear temporal-phase modulation. We present a new reconstruction algorithm for accurately characterizing chirped pulses, even if the pulse extends beyond the linear region of the phase modulation. Furthermore, since EOSI does not rely on nonlinear optical processes, it requires only 1 nJ pulse energies for all pulse widths, corresponding to a single-shot sensitivity 1000 × higher than previously demonstrated.

© 2006 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(320.5520) Ultrafast optics : Pulse compression
(320.7100) Ultrafast optics : Ultrafast measurements

ToC Category:
Ultrafast Optics

Original Manuscript: July 27, 2006
Manuscript Accepted: September 5, 2006
Published: November 9, 2006

J. Bromage, C. Dorrer, I. A. Begishev, N. G. Usechak, and J. D. Zuegel, "Highly sensitive, single-shot characterization for pulse widths from 0.4 to 85 ps using electro-optic shearing interferometry," Opt. Lett. 31, 3523-3525 (2006)

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