Highly sensitive, single-shot characterization for pulse widths from 0.4 to 85 ps using electro-optic shearing interferometry
Optics Letters, Vol. 31, Issue 23, pp. 3523-3525 (2006)
http://dx.doi.org/10.1364/OL.31.003523
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Abstract
Single-shot characterization using electro-optic shearing interferometry (EOSI) is shown for pulse widths ranging from their transform limit
© 2006 Optical Society of America
OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(320.5520) Ultrafast optics : Pulse compression
(320.7100) Ultrafast optics : Ultrafast measurements
ToC Category:
Ultrafast Optics
History
Original Manuscript: July 27, 2006
Manuscript Accepted: September 5, 2006
Published: November 9, 2006
Citation
J. Bromage, C. Dorrer, I. A. Begishev, N. G. Usechak, and J. D. Zuegel, "Highly sensitive, single-shot characterization for pulse widths from 0.4 to 85 ps using electro-optic shearing interferometry," Opt. Lett. 31, 3523-3525 (2006)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-31-23-3523
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