Least-squares fitting of carrier phase distribution by using a rational function in fringe projection profilometry
Optics Letters, Vol. 31, Issue 24, pp. 3588-3590 (2006)
http://dx.doi.org/10.1364/OL.31.003588
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Abstract
A least-squares fitting technique for the carrier phase component in fringe projection profilometry is presented. The carrier phase distribution for an arbitrary measurement system can be perfectly described with a rational function, whose coefficients can be estimated by least-squares fitting to the measured reference phases, so that the restrictions and limitations in the existing techniques are eliminated.
© 2006 Optical Society of America
OCIS Codes
(120.2830) Instrumentation, measurement, and metrology : Height measurements
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(150.6910) Machine vision : Three-dimensional sensing
ToC Category:
Instrumentation, Measurement, and Metrology
History
Original Manuscript: August 7, 2006
Revised Manuscript: September 8, 2006
Manuscript Accepted: September 22, 2006
Published: November 22, 2006
Citation
Hongwei Guo, Mingyi Chen, and Peng Zheng, "Least-squares fitting of carrier phase distribution by using a rational function in fringe projection profilometry," Opt. Lett. 31, 3588-3590 (2006)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-31-24-3588
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