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Optics Letters

Optics Letters


  • Editor: Anthony J. Campillo
  • Vol. 31, Iss. 4 — Feb. 15, 2006
  • pp: 477–479

Single-exposure optical sectioning by color structured illumination microscopy

Leo G. Krzewina and Myung K. Kim  »View Author Affiliations

Optics Letters, Vol. 31, Issue 4, pp. 477-479 (2006)

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Structured illumination microscopy (SIM) is a wide-field technique that rivals confocal microscopy in optical sectioning ability at a small fraction of the acquisition time. For standard detectors such as a CCD camera, SIM requires a minimum of three sequential frame captures, limiting its usefulness to static objects. By using a color grid and camera, we surpass this limit and achieve optical sectioning with just a single image acquisition. The extended method is now applicable to moving objects and improves the speed of three-dimensional imaging of static objects by at least a factor of three.

© 2006 Optical Society of America

OCIS Codes
(110.0180) Imaging systems : Microscopy
(110.6880) Imaging systems : Three-dimensional image acquisition
(180.6900) Microscopy : Three-dimensional microscopy

ToC Category:

Original Manuscript: September 9, 2005
Revised Manuscript: November 17, 2005
Manuscript Accepted: November 19, 2005

Virtual Issues
Vol. 1, Iss. 3 Virtual Journal for Biomedical Optics

Leo G. Krzewina and Myung K. Kim, "Single-exposure optical sectioning by color structured illumination microscopy," Opt. Lett. 31, 477-479 (2006)

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