Structured illumination microscopy (SIM) is a wide-field technique that rivals confocal microscopy in optical sectioning ability at a small fraction of the acquisition time. For standard detectors such as a CCD camera, SIM requires a minimum of three sequential frame captures, limiting its usefulness to static objects. By using a color grid and camera, we surpass this limit and achieve optical sectioning with just a single image acquisition. The extended method is now applicable to moving objects and improves the speed of three-dimensional imaging of static objects by at least a factor of three.
© 2006 Optical Society of America
Original Manuscript: September 9, 2005
Revised Manuscript: November 17, 2005
Manuscript Accepted: November 19, 2005
Vol. 1, Iss. 3 Virtual Journal for Biomedical Optics
Leo G. Krzewina and Myung K. Kim, "Single-exposure optical sectioning by color structured illumination microscopy," Opt. Lett. 31, 477-479 (2006)