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Optics Letters

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  • Editor: Anthony J. Campillo
  • Vol. 31, Iss. 5 — Mar. 1, 2006
  • pp: 589–591

Chromatically dispersed interferometry with wavelet analysis

Evangelos Papastathopoulos, Klaus Körner, and Wolfgang Osten  »View Author Affiliations


Optics Letters, Vol. 31, Issue 5, pp. 589-591 (2006)
http://dx.doi.org/10.1364/OL.31.000589


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Abstract

A new white-light interferometry point sensor utilizing a chromatically dispersed depth detection field is addressed. Monitoring the interference in the optical frequency domain allows for microscopic height detection without the necessity of a mechanical axial scan. The problem of limited dynamic range in previously reported spectral interferometric schemes is solved by forming a high-contrast interference window due to the chromatically dispersed focusing of the detection field. In a proof-of-principle experiment, the position of a reflecting object could be retrieved with a focus of 0.8 NA over an axial range of 30 μ m by analyzing the phase of the emerging interference wavelets.

© 2006 Optical Society of America

OCIS Codes
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.4570) Instrumentation, measurement, and metrology : Optical design of instruments
(180.3170) Microscopy : Interference microscopy

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: October 24, 2005
Manuscript Accepted: November 18, 2005

Virtual Issues
Vol. 1, Iss. 4 Virtual Journal for Biomedical Optics

Citation
Evangelos Papastathopoulos, Klaus Körner, and Wolfgang Osten, "Chromatically dispersed interferometry with wavelet analysis," Opt. Lett. 31, 589-591 (2006)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-31-5-589


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