Phase-shifting interferometry in the presence of nonlinear phase steps, harmonics, and noise
Optics Letters, Vol. 31, Issue 8, pp. 1058-1060 (2006)
http://dx.doi.org/10.1364/OL.31.001058
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Abstract
A phase-shifting piezo device commonly employed in phase-shifting interferometry exhibits a nonlinear response to applied voltage. Hence, a method for estimation of phase distribution in the presence of nonlinear phase steps is presented. The proposed method compensates for the harmonics present in the intensity fringe, allows the use of arbitrary phase-step values between 0 and
© 2006 Optical Society of America
OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
ToC Category:
Instrumentation, Measurement, and Metrology
History
Original Manuscript: December 12, 2005
Revised Manuscript: January 18, 2006
Manuscript Accepted: January 19, 2006
Citation
Rajesh Langoju, Abhijit Patil, and Pramod Rastogi, "Phase-shifting interferometry in the presence of nonlinear phase steps, harmonics, and noise," Opt. Lett. 31, 1058-1060 (2006)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-31-8-1058
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