Dynamic speckle illumination microscopy with wavelet prefiltering
Optics Letters, Vol. 32, Issue 11, pp. 1417-1419 (2007)
http://dx.doi.org/10.1364/OL.32.001417
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Abstract
Dynamic speckle illumination (DSI) provides a simple and robust technique to obtain fluorescence depth sectioning with a widefield microscope. We report a significant improvement to DSI microscopy based on a statistical image-processing algorithm that incorporates spatial wavelet prefiltering. The resultant gain in sectioning strength leads to a fundamentally improved scaling law for the out-of-focus background rejection.
© 2007 Optical Society of America
OCIS Codes
(180.1790) Microscopy : Confocal microscopy
(180.2520) Microscopy : Fluorescence microscopy
(180.6900) Microscopy : Three-dimensional microscopy
ToC Category:
Microscopy
History
Original Manuscript: January 18, 2007
Revised Manuscript: March 7, 2007
Manuscript Accepted: March 15, 2007
Published: April 27, 2007
Virtual Issues
Vol. 2, Iss. 7 Virtual Journal for Biomedical Optics
Citation
Cathie Ventalon, Rainer Heintzmann, and Jerome Mertz, "Dynamic speckle illumination microscopy with wavelet prefiltering," Opt. Lett. 32, 1417-1419 (2007)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-32-11-1417
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