Dynamic speckle illumination (DSI) provides a simple and robust technique to obtain fluorescence depth sectioning with a widefield microscope. We report a significant improvement to DSI microscopy based on a statistical image-processing algorithm that incorporates spatial wavelet prefiltering. The resultant gain in sectioning strength leads to a fundamentally improved scaling law for the out-of-focus background rejection.
© 2007 Optical Society of America
Original Manuscript: January 18, 2007
Revised Manuscript: March 7, 2007
Manuscript Accepted: March 15, 2007
Published: April 27, 2007
Vol. 2, Iss. 7 Virtual Journal for Biomedical Optics
Cathie Ventalon, Rainer Heintzmann, and Jerome Mertz, "Dynamic speckle illumination microscopy with wavelet prefiltering," Opt. Lett. 32, 1417-1419 (2007)