Tamper resistance in optical excitation transfer based on optical near-field interactions
Optics Letters, Vol. 32, Issue 12, pp. 1761-1763 (2007)
http://dx.doi.org/10.1364/OL.32.001761
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Abstract
We present tamper resistance in optical excitation transfer via optical near-field interactions based on the energy dissipation process occurring locally in nanometric devices such as quantum dots. A theoretical comparison with electrical systems is also shown, focusing on the required environmental conditions. Numerical simulations based on virtual photon models demonstrate high tamper resistance.
© 2007 Optical Society of America
OCIS Codes
(070.6020) Fourier optics and signal processing : Continuous optical signal processing
(260.2110) Physical optics : Electromagnetic optics
(270.0270) Quantum optics : Quantum optics
ToC Category:
Quantum Optics
History
Original Manuscript: February 5, 2007
Manuscript Accepted: April 26, 2007
Published: June 13, 2007
Citation
Makoto Naruse, Hirokazu Hori, Kiyoshi Kobayashi, and Motoichi Ohtsu, "Tamper resistance in optical excitation transfer based on optical near-field interactions," Opt. Lett. 32, 1761-1763 (2007)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-32-12-1761
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