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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Anthony J. Campillo
  • Vol. 32, Iss. 14 — Jul. 15, 2007
  • pp: 1968–1970

Single-shot terahertz pulse characterization via two-dimensional electro-optic imaging with dual echelons

K. Y. Kim, B. Yellampalle, A. J. Taylor, G. Rodriguez, and J. H. Glownia  »View Author Affiliations


Optics Letters, Vol. 32, Issue 14, pp. 1968-1970 (2007)
http://dx.doi.org/10.1364/OL.32.001968


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Abstract

A single-shot measurement of terahertz electromagnetic pulses is implemented using two-dimensional electro-optic imaging with dual echelon optics. The reported embodiment produces sequentially delayed multiprobe beamlets, routinely providing a time window of > 10 ps with 25 fs temporal step sizes. Because of its simplicity and robustness, the technique is ideally suited for real-time ultrashort relativistic electron bunch characterization.

© 2007 Optical Society of America

OCIS Codes
(300.6270) Spectroscopy : Spectroscopy, far infrared
(300.6530) Spectroscopy : Spectroscopy, ultrafast
(320.7150) Ultrafast optics : Ultrafast spectroscopy

ToC Category:
Spectroscopy

History
Original Manuscript: March 8, 2007
Revised Manuscript: May 2, 2007
Manuscript Accepted: May 5, 2007
Published: July 3, 2007

Citation
K. Y. Kim, B. Yellampalle, A. J. Taylor, G. Rodriguez, and J. H. Glownia, "Single-shot terahertz pulse characterization via two-dimensional electro-optic imaging with dual echelons," Opt. Lett. 32, 1968-1970 (2007)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-32-14-1968

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