Terahertz direct-contact refractometer/spectrometer
Optics Letters, Vol. 32, Issue 14, pp. 2043-2045 (2007)
http://dx.doi.org/10.1364/OL.32.002043
Enhanced HTML 
Acrobat PDF (243 KB)
Abstract
A method for terahertz (THz) reflection spectroscopy is presented that utilizes direct contact between the backside of the pulsed emitter and the sample. Changes in the complex reflectivity of the emitter–sample interface are used to measure the spectrum. This method is especially useful for spectroscopy of liquid samples and soft materials. It simplifies the optical apparatus, has good sensitivity, and has capability for use in the construction of miniaturized THz probes. The problem of nonplanar wave fronts inside the emitter is discussed.
© 2007 Optical Society of America
OCIS Codes
(120.5700) Instrumentation, measurement, and metrology : Reflection
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation
(300.6270) Spectroscopy : Spectroscopy, far infrared
ToC Category:
Spectroscopy
History
Original Manuscript: April 18, 2007
Revised Manuscript: May 17, 2007
Manuscript Accepted: May 21, 2007
Published: July 9, 2007
Citation
Ole Hirsch and Paul Alexander, "Terahertz direct-contact refractometer/spectrometer," Opt. Lett. 32, 2043-2045 (2007)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-32-14-2043
You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
Related Journal Articles 
- Design of an Efficient Broadband Far-Infrared Fourier-Transform Spectrometer (AO)
- Gonioreflectometer for Measuring Spectral Diffuse Reflectance (AO)
- Dynamic range in terahertz time-domain transmission and reflection spectroscopy (OL)
- Design and characterization of a versatile reference instrument for rapid, reproducible specular gloss measurements (AO)
- Detection and identification of explosive RDX by THz diffuse reflection spectroscopy (OE)
Related Conference Papers
- Phonon-polariton based THz spectroscopy
- THz absorption spectrum of explosive material 2,4-DNT obtained by THz differential time domain spectroscopy
- Identification of petroleum products by THz-spectroscopy
- Terahertz Frequency-Domain Spectroscopy Referring to as Terahertz Frequency Comb
- Terahertz Frequency Comb for High-Accuracy, High-Resolution Terahertz Spectroscopy
« Previous Article | Next Article »
OSA is a member of 