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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Anthony J. Campillo
  • Vol. 32, Iss. 14 — Jul. 15, 2007
  • pp: 2043–2045

Terahertz direct-contact refractometer/spectrometer

Ole Hirsch and Paul Alexander  »View Author Affiliations


Optics Letters, Vol. 32, Issue 14, pp. 2043-2045 (2007)
http://dx.doi.org/10.1364/OL.32.002043


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Abstract

A method for terahertz (THz) reflection spectroscopy is presented that utilizes direct contact between the backside of the pulsed emitter and the sample. Changes in the complex reflectivity of the emitter–sample interface are used to measure the spectrum. This method is especially useful for spectroscopy of liquid samples and soft materials. It simplifies the optical apparatus, has good sensitivity, and has capability for use in the construction of miniaturized THz probes. The problem of nonplanar wave fronts inside the emitter is discussed.

© 2007 Optical Society of America

OCIS Codes
(120.5700) Instrumentation, measurement, and metrology : Reflection
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation
(300.6270) Spectroscopy : Spectroscopy, far infrared

ToC Category:
Spectroscopy

History
Original Manuscript: April 18, 2007
Revised Manuscript: May 17, 2007
Manuscript Accepted: May 21, 2007
Published: July 9, 2007

Citation
Ole Hirsch and Paul Alexander, "Terahertz direct-contact refractometer/spectrometer," Opt. Lett. 32, 2043-2045 (2007)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-32-14-2043

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