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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Anthony J. Campilo
  • Vol. 32, Iss. 17 — Sep. 1, 2007
  • pp: 2602–2604

Effects produced by metal-coated near-field probes on the performance of silicon waveguides and resonators

Maxim Abashin, Uriel Levy, Kazuhiro Ikeda, and Yeshaiahu Fainman  »View Author Affiliations


Optics Letters, Vol. 32, Issue 17, pp. 2602-2604 (2007)
http://dx.doi.org/10.1364/OL.32.002602


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Abstract

We study the effects of metal-coated fiber near-field probes on the performance of nanophotonic devices. Employing a heterodyne near-field scanning optical microscope and analyzing transmission characteristics, we find that a metal-coated probe can typically introduce a 3 dB intensity loss and a 0.2 rad phase shift during characterization of a straight waveguide made in a silicon-on-insulator system. In resonant nanophotonic structures such as a 5 μ m radius microring resonator, we demonstrate that the probe induces a 1 nm shift in resonant wavelength and decreases the resonator quality factor, Q, from 1100 to 480.

© 2007 Optical Society of America

OCIS Codes
(180.5810) Microscopy : Scanning microscopy
(230.5750) Optical devices : Resonators
(230.7370) Optical devices : Waveguides

ToC Category:
Optical Devices

History
Original Manuscript: April 30, 2007
Revised Manuscript: June 26, 2007
Manuscript Accepted: June 28, 2007
Published: August 24, 2007

Citation
Maxim Abashin, Uriel Levy, Kazuhiro Ikeda, and Yeshaiahu Fainman, "Effects produced by metal-coated near-field probes on the performance of silicon waveguides and resonators," Opt. Lett. 32, 2602-2604 (2007)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-32-17-2602

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