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Optics Letters


  • Editor: Anthony J. Campillo
  • Vol. 32, Iss. 18 — Sep. 15, 2007
  • pp: 2659–2661

C n 2 profile measurement from Shack–Hartmann data

Nicolas Védrenne, Vincent Michau, Clélia Robert, and Jean-Marc Conan  »View Author Affiliations

Optics Letters, Vol. 32, Issue 18, pp. 2659-2661 (2007)

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C n 2 profile monitoring usually relies on the exploitation of wavefront slope correlations or of scintillation pattern correlations. Scintillation is rather sensitive to high turbulence layers whereas wavefront slope correlations are mainly due to layers close to the receiving plane. Wavefront slope and scintillation correlations are therefore complementary. A Shack–Hartmann wavefront sensor (SHWFS) is currently used to measure wavefront slopes only. But it could also be sensitive to scintillation as the average intensity in a given subaperture can be obtained by adding pixel intensities in the subaperture focal plane up. With slopes and scintillation being recorded simultaneously, their correlation is also theoretically available. We propose to exploit wavefront slope and scintillation correlations recorded with a SHWFS to retrieve the C n 2 profile. Two measurement methods are exposed. In CO-SLIDAR (Coupled SLODAR SCIDAR), correlations of SHWFS data recorded on two separated stars are exploited. SCO-SLIDAR (Single CO-SLIDAR) relies on the same principle as CO-SLIDAR, but SHWFS data are recorded on a single star. Results of C n 2 estimation from simulated SHWFS data are presented.

© 2007 Optical Society of America

OCIS Codes
(010.1080) Atmospheric and oceanic optics : Active or adaptive optics
(010.7350) Atmospheric and oceanic optics : Wave-front sensing
(100.3190) Image processing : Inverse problems
(280.7060) Remote sensing and sensors : Turbulence

ToC Category:
Atmospheric and Oceanic Optics

Original Manuscript: April 12, 2007
Revised Manuscript: June 28, 2007
Manuscript Accepted: June 29, 2007
Published: September 4, 2007

Nicolas Védrenne, Vincent Michau, Clélia Robert, and Jean-Marc Conan, "Cn2 profile measurement from Shack-Hartmann data," Opt. Lett. 32, 2659-2661 (2007)

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