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Optics Letters

Optics Letters


  • Editor: Anthony J. Campillo
  • Vol. 32, Iss. 18 — Sep. 15, 2007
  • pp: 2723–2725

Dispersion properties of silicon nanophotonic waveguides investigated with Fourier optics

J. Jágerská, N. Le Thomas, R. Houdré, J. Bolten, C. Moormann, T. Wahlbrink, J. Čtyroký, M. Waldow, and M. Först  »View Author Affiliations

Optics Letters, Vol. 32, Issue 18, pp. 2723-2725 (2007)

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We experimentally investigate the dispersion relation of silicon-on-insulator waveguides in the 1.5 μ m wavelength range by using a technique based on far-field Fourier-space imaging. The phase information of the propagating modes is transferred into the far field either by linear probe gratings positioned 1 μ m away from the waveguide core or by residual gratings located on the sidewalls of the waveguide. As a result, the dispersion curve of rectangular and slot waveguides as well as the group index dispersion are accurately determined.

© 2007 Optical Society of America

OCIS Codes
(070.0070) Fourier optics and signal processing : Fourier optics and signal processing
(130.0130) Integrated optics : Integrated optics
(130.2790) Integrated optics : Guided waves
(130.5990) Integrated optics : Semiconductors

ToC Category:
Integrated Optics

Original Manuscript: July 6, 2007
Manuscript Accepted: July 19, 2007
Published: September 11, 2007

J. Jágerská, N. Le Thomas, R. Houdré, J. Bolten, C. Moormann, T. Wahlbrink, J. Ctyroký, M. Waldow, and M. Först, "Dispersion properties of silicon nanophotonic waveguides investigated with Fourier optics," Opt. Lett. 32, 2723-2725 (2007)

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