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Optics Letters

Optics Letters


  • Editor: Anthony J. Campillo
  • Vol. 32, Iss. 19 — Oct. 1, 2007
  • pp: 2801–2803

Low-loss, low-cross-talk crossings for silicon-on-insulator nanophotonic waveguides

Wim Bogaerts, Pieter Dumon, Dries Van Thourhout, and Roel Baets  »View Author Affiliations

Optics Letters, Vol. 32, Issue 19, pp. 2801-2803 (2007)

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We present compact crossings for silicon-on-insulator photonic wires. The waveguides are broadened using a 3 μ m parabolic taper in each arm. By locally applying a lower index contrast using a double-etch technique, loss of confinement is reduced and 97.5 % transmission ( 1.7 dB ) is achieved with only 40 dB cross talk.

© 2007 Optical Society of America

OCIS Codes
(130.0130) Integrated optics : Integrated optics
(130.1750) Integrated optics : Components
(130.2790) Integrated optics : Guided waves

ToC Category:
Integrated Optics

Original Manuscript: July 25, 2007
Manuscript Accepted: August 14, 2007
Published: September 20, 2007

Wim Bogaerts, Pieter Dumon, Dries Van Thourhout, and Roel Baets, "Low-loss, low-cross-talk crossings for silicon-on-insulator nanophotonic waveguides," Opt. Lett. 32, 2801-2803 (2007)

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  1. W. Bogaerts, R. Baets, P. Dumon, V. Wiaux, S. Beckx, D. Taillaert, B. Luyssaert, J. Van Campenhout, P. Bienstman, and D. Van Thourhout, J. Lightwave Technol. 23, 401 (2005). [CrossRef]
  2. W. Bogaerts, P. Dumon, D. Van Thourhout, D. Taillaert, P. Jaenen, J. Wouters, B. S. V. Wiaux, and R. Baets, IEEE J. Sel. Top. Quantum Electron. 12, 1394 (2006). [CrossRef]
  3. H. Chen and A. Poon, IEEE Photon. Technol. Lett. 18, 2260 (2006). [CrossRef]
  4. T. Fukazawa, T. Hirano, F. Ohno, and T. Baba, Jpn. J. Appl. Phys., Part 1 43, 646 (2004). [CrossRef]
  5. C. Wei, F. Groen, M. Smit, I. Moerman, P. Van Daele, and R. Baets, J. Lightwave Technol. 15, 906 (1997). [CrossRef]
  6. S. Johnson, C. Manolatou, S. Fan, P. Villeneuve, J. Joannopoulos, and H. Haus, Opt. Lett. 23, 1855 (1998). [CrossRef]
  7. D. Taillaert, W. Bogaerts, P. Bienstman, T. Krauss, P. Van Daele, I. Moerman, S. Verstuyft, K. De Mesel, and R. Baets, IEEE J. Quantum Electron. 38, 949 (2002). [CrossRef]

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