Edge-view photodetector for optical interconnects
Optics Letters, Vol. 32, Issue 20, pp. 2906-2908 (2007)
http://dx.doi.org/10.1364/OL.32.002906
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Abstract
A new semiconductor photodetector design is reported. The PIN active area of the photodetector is fabricated on a sloping sidewall of a mesa structure. The photodetector is referred to as an edge-view photodetector (EVPD) and simplifies the integration of optical circuits by direct end coupling, eliminating the need for
© 2007 Optical Society of America
OCIS Codes
(040.5160) Detectors : Photodetectors
(130.3120) Integrated optics : Integrated optics devices
(130.5990) Integrated optics : Semiconductors
(160.2100) Materials : Electro-optical materials
(230.0040) Optical devices : Detectors
ToC Category:
Optical Devices
History
Original Manuscript: June 6, 2007
Revised Manuscript: August 31, 2007
Manuscript Accepted: September 2, 2007
Published: October 1, 2007
Citation
Zhihua Li, Huajun Shen, Chengyue Yang, Baoxia Li, Lixi Wan, and Daniel Guidotti, "Edge-view photodetector for optical interconnects," Opt. Lett. 32, 2906-2908 (2007)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-32-20-2906
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