Accurate measurement of scattering and absorption loss in microphotonic devices
Optics Letters, Vol. 32, Issue 20, pp. 2954-2956 (2007)
http://dx.doi.org/10.1364/OL.32.002954
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Abstract
We present a simple measurement and analysis technique to determine the fraction of optical loss due to both radiation (scattering) and linear absorption in microphotonic components. The method is generally applicable to optical materials in which both nonlinear and linear absorption are present and requires only limited knowledge of absolute optical power levels, material parameters, and the structure geometry. The technique is applied to high-quality-factor (
© 2007 Optical Society of America
OCIS Codes
(230.3990) Optical devices : Micro-optical devices
(140.3945) Lasers and laser optics : Microcavities
ToC Category:
Optical Devices
History
Original Manuscript: July 10, 2007
Revised Manuscript: September 10, 2007
Manuscript Accepted: September 10, 2007
Published: October 5, 2007
Citation
Matthew Borselli, Thomas J. Johnson, and Oskar Painter, "Accurate measurement of scattering and absorption loss in microphotonic devices," Opt. Lett. 32, 2954-2956 (2007)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-32-20-2954
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