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Optics Letters

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  • Editor: Anthony J. Campillo
  • Vol. 32, Iss. 20 — Oct. 15, 2007
  • pp: 2954–2956

Accurate measurement of scattering and absorption loss in microphotonic devices

Matthew Borselli, Thomas J. Johnson, and Oskar Painter  »View Author Affiliations


Optics Letters, Vol. 32, Issue 20, pp. 2954-2956 (2007)
http://dx.doi.org/10.1364/OL.32.002954


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Abstract

We present a simple measurement and analysis technique to determine the fraction of optical loss due to both radiation (scattering) and linear absorption in microphotonic components. The method is generally applicable to optical materials in which both nonlinear and linear absorption are present and requires only limited knowledge of absolute optical power levels, material parameters, and the structure geometry. The technique is applied to high-quality-factor ( Q = 1 × 10 6 to Q = 5 × 10 6 ) silicon-on-insulator (SOI) microdisk resonators. It is determined that linear absorption can account for more than half of the total optical loss in the high-Q regime of these devices.

© 2007 Optical Society of America

OCIS Codes
(230.3990) Optical devices : Micro-optical devices
(140.3945) Lasers and laser optics : Microcavities

ToC Category:
Optical Devices

History
Original Manuscript: July 10, 2007
Revised Manuscript: September 10, 2007
Manuscript Accepted: September 10, 2007
Published: October 5, 2007

Citation
Matthew Borselli, Thomas J. Johnson, and Oskar Painter, "Accurate measurement of scattering and absorption loss in microphotonic devices," Opt. Lett. 32, 2954-2956 (2007)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-32-20-2954


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