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Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Anthony J. Campillo
  • Vol. 32, Iss. 4 — Feb. 15, 2007
  • pp: 421–423

Fourier transform emission lifetime spectrometer

Leilei Peng, Jason T. Motz, Robert W. Redmond, Brett E. Bouma, and Guillermo J. Tearney  »View Author Affiliations


Optics Letters, Vol. 32, Issue 4, pp. 421-423 (2007)
http://dx.doi.org/10.1364/OL.32.000421


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Abstract

We report a rapid and low cost Fourier transform spectrometer that uses a path length modulated Michelson interferometer to simultaneously measure excitation spectra and excitation wavelength-dependent emission lifetimes. Excitation spectra and lifetimes of excited tris(2, 2 -bipyridyl) ruthenium(II) measured using this technique corresponded to values known in the literature. Excitation-dependent lifetimes of porous silicon measured with this technique suggest the influence of quantum confinement effects. This method may be useful for measuring mixtures of emitting species with closely spaced lifetimes as well as studying excitation wavelength-dependent emission phenomena.

© 2007 Optical Society of America

OCIS Codes
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation
(300.0300) Spectroscopy : Spectroscopy
(300.6300) Spectroscopy : Spectroscopy, Fourier transforms

ToC Category:
Spectroscopy

History
Original Manuscript: August 15, 2006
Revised Manuscript: October 6, 2006
Manuscript Accepted: October 6, 2006
Published: January 26, 2007

Citation
Leilei Peng, Jason T. Motz, Robert W. Redmond, Brett E. Bouma, and Guillermo J. Tearney, "Fourier transform emission lifetime spectrometer," Opt. Lett. 32, 421-423 (2007)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-32-4-421


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