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Optics Letters

Optics Letters


  • Vol. 32, Iss. 5 — Mar. 1, 2007
  • pp: 536–538

Temperature-dependent Sellmeier equation for the refractive index of Al x Ga 1 x As

Jang Pyo Kim and Andrew M. Sarangan  »View Author Affiliations

Optics Letters, Vol. 32, Issue 5, pp. 536-538 (2007)

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We derived a temperature-dependent Sellmeier equation for Al x Ga 1 x As material by measuring the refractive index of GaAs and AlAs with temperature dependence in a resonant cavity enhanced structure. The equation is applicable in the range of 1460 1580 nm and 26 86 ° C and can be extrapolated to the other wavelengths and temperature ranges as well.

© 2007 Optical Society of America

OCIS Codes
(120.4530) Instrumentation, measurement, and metrology : Optical constants
(120.6780) Instrumentation, measurement, and metrology : Temperature
(120.6810) Instrumentation, measurement, and metrology : Thermal effects
(230.1480) Optical devices : Bragg reflectors

ToC Category:
Optical Devices

Original Manuscript: November 9, 2006
Revised Manuscript: November 9, 2006
Manuscript Accepted: November 26, 2006
Published: February 2, 2007

Jang Pyo Kim and Andrew M. Sarangan, "Temperature-dependent Sellmeier equation for the refractive index of AlxGa1−xAs," Opt. Lett. 32, 536-538 (2007)

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  1. M. V. Hobden and J. Earner, Phys. Lett. 22, 243 (1966). [CrossRef]
  2. N. P. Barnes and M. S. Piltch, J. Opt. Soc. Am. 67, 628 (1977). [CrossRef]
  3. D. H. Jundt, Opt. Lett. 22, 1553 (1997). [CrossRef]
  4. A. Bruner, D. Eger, M. B. Oron, P. Blau, and M. Katz, Opt. Lett. 23, 194 (2003). [CrossRef]
  5. H. Y. Shen, X. L. Meng, G. Zhang, J. J. Qin, W. Liu, L. Zhu, C. H. Huang, L. X. Huang, and M. Wei, Appl. Opt. 43, 955 (2004). [CrossRef] [PubMed]
  6. J. T. Boyd, IEEE J. Quantum Electron. 8, 788 (1972). [CrossRef]
  7. M. Ilegems and G. L. Pearson, Phys. Rev. B 1, 1576 (1970). [CrossRef]
  8. M. Ettenberg and R. J. Paff, J. Appl. Phys. 41, 3926 (1970). [CrossRef]
  9. S. Adachi, J. Appl. Phys. 58, R1 (1985). [CrossRef]
  10. J. Talghader and J. S. Smith, Appl. Phys. Lett. 66, 335 (1970). [CrossRef]
  11. F. G. D. Corte, G. Cocorullo, M. Lodice, and I. Rendina, Appl. Phys. Lett. 77, 1614 (2000). [CrossRef]
  12. J. P. Kim and A. M. Sarangan, in Proceedings of CLEO/Europe (Optical Society of America, 2005), paper CE7-6-THU.
  13. S. Gehrsitz, F. K. Reinhart, C. Gourgon, N. Herres, A. Vonlanthen, and H. Sigg, J. Appl. Phys. 87, 7825 (2000). [CrossRef]
  14. H. Kawai, S. Imanaga, K. Kaneko, and N. Watanabe, J. Appl. Phys. 61, 328 (1986). [CrossRef]

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