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Optics Letters

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  • Vol. 32, Iss. 5 — Mar. 1, 2007
  • pp: 536–538

Temperature-dependent Sellmeier equation for the refractive index of Al x Ga 1 x As

Jang Pyo Kim and Andrew M. Sarangan  »View Author Affiliations


Optics Letters, Vol. 32, Issue 5, pp. 536-538 (2007)
http://dx.doi.org/10.1364/OL.32.000536


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Abstract

We derived a temperature-dependent Sellmeier equation for Al x Ga 1 x As material by measuring the refractive index of GaAs and AlAs with temperature dependence in a resonant cavity enhanced structure. The equation is applicable in the range of 1460 1580 nm and 26 86 ° C and can be extrapolated to the other wavelengths and temperature ranges as well.

© 2007 Optical Society of America

OCIS Codes
(120.4530) Instrumentation, measurement, and metrology : Optical constants
(120.6780) Instrumentation, measurement, and metrology : Temperature
(120.6810) Instrumentation, measurement, and metrology : Thermal effects
(230.1480) Optical devices : Bragg reflectors

ToC Category:
Optical Devices

History
Original Manuscript: November 9, 2006
Revised Manuscript: November 9, 2006
Manuscript Accepted: November 26, 2006
Published: February 2, 2007

Citation
Jang Pyo Kim and Andrew M. Sarangan, "Temperature-dependent Sellmeier equation for the refractive index of AlxGa1−xAs," Opt. Lett. 32, 536-538 (2007)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-32-5-536

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