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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Anthony J. Campillo
  • Vol. 32, Iss. 6 — Mar. 15, 2007
  • pp: 647–649

Refractive index measurement by spectrally resolved interferometry using a femtosecond pulse laser

Ki-Nam Joo and Seung-Woo Kim  »View Author Affiliations


Optics Letters, Vol. 32, Issue 6, pp. 647-649 (2007)
http://dx.doi.org/10.1364/OL.32.000647


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Abstract

We describe a measurement method of refractive indices by way of spectrally resolved interferometry using a femtosecond pulse laser. The method is dispersion insensitive and requires no prior precise knowledge of the geometrical thickness of the specimen. Not only the group but also the phase refractive index can be determined over the wide spectral range covered by the optical comb of the femtosecond pulse laser in use.

© 2007 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.3940) Instrumentation, measurement, and metrology : Metrology
(140.7090) Lasers and laser optics : Ultrafast lasers

ToC Category:
Lasers and Laser Optics

History
Original Manuscript: October 3, 2006
Revised Manuscript: November 28, 2006
Manuscript Accepted: December 5, 2006
Published: February 15, 2007

Citation
Ki-Nam Joo and Seung-Woo Kim, "Refractive index measurement by spectrally resolved interferometry using a femtosecond pulse laser," Opt. Lett. 32, 647-649 (2007)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-32-6-647

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