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Optics Letters

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  • Editor: Anthony J. Campillo
  • Vol. 32, Iss. 6 — Mar. 15, 2007
  • pp: 722–724

Single-shot spatial-coherence measurement of 13 nm high-order harmonic beam by a Young's double-slit measurement

Yutaka Nagata, Kentaro Furusawa, Yasuo Nabekawa, and Katsumi Midorikawa  »View Author Affiliations


Optics Letters, Vol. 32, Issue 6, pp. 722-724 (2007)
http://dx.doi.org/10.1364/OL.32.000722


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Abstract

The interference pattern produced by a single 13nm high-order harmonic pulse is captured by an extreme-ultraviolet CCD camera. A beam divergence of 0.35 mrad and a high fringe visibility of 0.96 are obtained with an optimal phase-matching condition for the 13 nm harmonics. The spatial coherence length of the 13 nm harmonics selected by Mo/Si multilayer mirrors is larger than the beam diameter. This result shows that the 13 nm harmonic beam is useful for applications in interferometry, time-resolved studies of ultrafast dynamics.

© 2007 Optical Society of America

OCIS Codes
(030.1670) Coherence and statistical optics : Coherent optical effects
(140.7240) Lasers and laser optics : UV, EUV, and X-ray lasers
(260.3160) Physical optics : Interference
(320.0320) Ultrafast optics : Ultrafast optics
(340.0340) X-ray optics : X-ray optics

ToC Category:
X-ray Optics

History
Original Manuscript: November 6, 2006
Manuscript Accepted: November 21, 2006
Published: February 15, 2007

Citation
Yutaka Nagata, Kentaro Furusawa, Yasuo Nabekawa, and Katsumi Midorikawa, "Single-shot spatial-coherence measurement of 13 nm high-order harmonic beam by a Young's double-slit measurement," Opt. Lett. 32, 722-724 (2007)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-32-6-722


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