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Optics Letters

Optics Letters


  • Editor: Anthony J. Campillo
  • Vol. 32, Iss. 6 — Mar. 15, 2007
  • pp: 722–724

Single-shot spatial-coherence measurement of 13 nm high-order harmonic beam by a Young’s double-slit measurement

Yutaka Nagata, Kentaro Furusawa, Yasuo Nabekawa, and Katsumi Midorikawa  »View Author Affiliations

Optics Letters, Vol. 32, Issue 6, pp. 722-724 (2007)

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The interference pattern produced by a single 13 nm high-order harmonic pulse is captured by an extreme-ultraviolet CCD camera. A beam divergence of 0.35 mrad and a high fringe visibility of 0.96 are obtained with an optimal phase-matching condition for the 13 nm harmonics. The spatial coherence length of the 13 nm harmonics selected by Mo Si multilayer mirrors is larger than the beam diameter. This result shows that the 13 nm harmonic beam is useful for applications in interferometry, time-resolved studies of ultrafast dynamics.

© 2007 Optical Society of America

OCIS Codes
(030.1670) Coherence and statistical optics : Coherent optical effects
(140.7240) Lasers and laser optics : UV, EUV, and X-ray lasers
(260.3160) Physical optics : Interference
(320.0320) Ultrafast optics : Ultrafast optics
(340.0340) X-ray optics : X-ray optics

ToC Category:
X-ray Optics

Original Manuscript: November 6, 2006
Manuscript Accepted: November 21, 2006
Published: February 15, 2007

Yutaka Nagata, Kentaro Furusawa, Yasuo Nabekawa, and Katsumi Midorikawa, "Single-shot spatial-coherence measurement of 13 nm high-order harmonic beam by a Young's double-slit measurement," Opt. Lett. 32, 722-724 (2007)

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