Two-dimensional thermometry using temperature-induced line shifts of ZnO:Zn and ZnO:Ga fluorescence
Optics Letters, Vol. 33, Issue 12, pp. 1327-1329 (2008)
http://dx.doi.org/10.1364/OL.33.001327
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Abstract
Sensitive temperature-induced line shifts of the near-band-edge emission from
© 2008 Optical Society of America
OCIS Codes
(110.6820) Imaging systems : Thermal imaging
(120.0280) Instrumentation, measurement, and metrology : Remote sensing and sensors
(120.1740) Instrumentation, measurement, and metrology : Combustion diagnostics
(120.6780) Instrumentation, measurement, and metrology : Temperature
(300.2530) Spectroscopy : Fluorescence, laser-induced
ToC Category:
Instrumentation, Measurement, and Metrology
History
Original Manuscript: March 10, 2008
Revised Manuscript: April 21, 2008
Manuscript Accepted: April 28, 2008
Published: June 11, 2008
Citation
Gustaf Särner, Mattias Richter, and Marcus Aldén, "Two-dimensional thermometry using temperature-induced line shifts of ZnO:Zn and ZnO:Ga fluorescence," Opt. Lett. 33, 1327-1329 (2008)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-33-12-1327
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