Controlling the phase delay of light transmitted through double-layer metallic subwavelength slit arrays
Optics Letters, Vol. 33, Issue 13, pp. 1410-1412 (2008)
http://dx.doi.org/10.1364/OL.33.001410
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Abstract
We demonstrate that the phase of light transmitted through double-layer subwavelength metallic slit arrays can be controlled through lateral shift of the two layers. Our samples consist of two aluminum layers, each of which contains an array of subwavelength slits. The two layers are placed in sufficient proximity to allow coupling of the evanescent fields at resonance. By changing the lateral shift between the layers from zero to half the period, the phase of the transmitted electromagnetic field is increased by π, while the transmitted intensity remains high. Such a controllable phase delay could open new capabilities for nanophotonic devices that cannot be achieved with single-layer structures.
© 2008 Optical Society of America
OCIS Codes
(050.5080) Diffraction and gratings : Phase shift
(240.6680) Optics at surfaces : Surface plasmons
(240.6690) Optics at surfaces : Surface waves
(310.6860) Thin films : Thin films, optical properties
(310.4165) Thin films : Multilayer design
(310.6628) Thin films : Subwavelength structures, nanostructures
ToC Category:
Diffraction and Gratings
History
Original Manuscript: April 4, 2008
Revised Manuscript: May 14, 2008
Manuscript Accepted: May 15, 2008
Published: June 19, 2008
Citation
Z. Marcet, J. W. Paster, D. W. Carr, J. E. Bower, R. A. Cirelli, F. Klemens, W. M. Mansfield, J. F. Miner, C. S. Pai, and H. B. Chan, "Controlling the phase delay of light transmitted through double-layer metallic subwavelength slit arrays," Opt. Lett. 33, 1410-1412 (2008)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-33-13-1410
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