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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Alan E. Willner
  • Vol. 33, Iss. 14 — Jul. 15, 2008
  • pp: 1629–1631

Structured illumination in total internal reflection fluorescence microscopy using a spatial light modulator

Reto Fiolka, Markus Beck, and Andreas Stemmer  »View Author Affiliations


Optics Letters, Vol. 33, Issue 14, pp. 1629-1631 (2008)
http://dx.doi.org/10.1364/OL.33.001629


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Abstract

In wide-field fluorescence microscopy, illuminating the specimen with evanescent standing waves increases lateral resolution more than twofold. We report a versatile setup for standing-wave illumination in total internal reflection fluorescence microscopy. An adjustable diffraction grating written on a phase-only spatial light modulator controls the illumination field. Selecting appropriate diffraction orders and displaying a sheared (tilted) diffraction grating allows one to tune the penetration depth in very fine steps. The setup achieves 91 ‚ÄČ nm lateral resolution for green emission.

© 2008 Optical Society of America

OCIS Codes
(180.0180) Microscopy : Microscopy
(180.2520) Microscopy : Fluorescence microscopy
(180.3170) Microscopy : Interference microscopy

ToC Category:
Microscopy

History
Original Manuscript: April 10, 2008
Revised Manuscript: June 12, 2008
Manuscript Accepted: June 17, 2008
Published: July 14, 2008

Virtual Issues
Vol. 3, Iss. 8 Virtual Journal for Biomedical Optics

Citation
Reto Fiolka, Markus Beck, and Andreas Stemmer, "Structured illumination in total internal reflection fluorescence microscopy using a spatial light modulator," Opt. Lett. 33, 1629-1631 (2008)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-33-14-1629

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