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Optics Letters

Optics Letters


  • Editor: Alan E. Willner
  • Vol. 33, Iss. 15 — Aug. 1, 2008
  • pp: 1644–1646

High-speed electro-optic control of the optical quality factor of a silicon microcavity

Sasikanth Manipatruni, Carl B. Poitras, Qianfan Xu, and Michal Lipson  »View Author Affiliations

Optics Letters, Vol. 33, Issue 15, pp. 1644-1646 (2008)

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We demonstrate electro-optic ultrafast control of the optical quality factor of an on-chip silicon microcavity. The micrometer-sized cavity is formed by light confinement between two microring resonators acting as frequency selective mirrors. The ring resonators are integrated into p-i-n junctions enabling ultrafast injection and extraction of carriers. We show tuning of the cavity quality factor from 20,000 to 6,000 in under 100 ps . We demonstrate both high-Q to low-Q and low-Q to high-Q transitions.

© 2008 Optical Society of America

OCIS Codes
(130.3120) Integrated optics : Integrated optics devices
(130.3130) Integrated optics : Integrated optics materials
(230.5750) Optical devices : Resonators

ToC Category:
Optical Devices

Original Manuscript: February 12, 2008
Revised Manuscript: April 28, 2008
Published: July 18, 2008

Sasikanth Manipatruni, Carl B. Poitras, Qianfan Xu, and Michal Lipson, "High-speed electro-optic control of the optical quality factor of a silicon microcavity," Opt. Lett. 33, 1644-1646 (2008)

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  2. S. Preble, Q. Xu, and M. Lipson, Nat. Photonics 1, 293 (2007). [CrossRef]
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