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Optics Letters

Optics Letters


  • Editor: Alan E. Willner
  • Vol. 33, Iss. 16 — Aug. 15, 2008
  • pp: 1813–1815

Improved sectioning in a slit scanning confocal microscope

Vincent Poher, Gordon T. Kennedy, Hugh B. Manning, Dylan M. Owen, Haoxiang X. Zhang, Erdan Gu, Martin D. Dawson, Paul M.W. French, and Mark A.A. Neil  »View Author Affiliations

Optics Letters, Vol. 33, Issue 16, pp. 1813-1815 (2008)

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We describe a simple implementation of a slit scanning confocal microscope to obtain an axial resolution better than that of a point-scanning confocal microscope. Under slit illumination, images of a fluorescent object are captured using an array detector instead of a line detector so that out-of-focus light is recorded and then subtracted from the adjacent images. Axial resolution after background subtraction is 2.2 times better than the slit confocal resolution, and out-of-focus image suppression is calculated to attenuate with defocus faster by 1 order of magnitude than in the point confocal case.

© 2008 Optical Society of America

OCIS Codes
(170.2520) Medical optics and biotechnology : Fluorescence microscopy
(180.1790) Microscopy : Confocal microscopy
(230.3670) Optical devices : Light-emitting diodes

ToC Category:

Original Manuscript: March 27, 2008
Revised Manuscript: May 28, 2008
Published: August 6, 2008

Virtual Issues
Vol. 3, Iss. 10 Virtual Journal for Biomedical Optics

Vincent Poher, Gordon T. Kennedy, Hugh B. Manning, Dylan M. Owen, Haoxiang X. Zhang, Erdan Gu, Martin D. Dawson, Paul M. W. French, and Mark A. A. Neil, "Improved sectioning in a slit scanning confocal microscope," Opt. Lett. 33, 1813-1815 (2008)

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