We describe a simple implementation of a slit scanning confocal microscope to obtain an axial resolution better than that of a point-scanning confocal microscope. Under slit illumination, images of a fluorescent object are captured using an array detector instead of a line detector so that out-of-focus light is recorded and then subtracted from the adjacent images. Axial resolution after background subtraction is 2.2 times better than the slit confocal resolution, and out-of-focus image suppression is calculated to attenuate with defocus faster by 1 order of magnitude than in the point confocal case.
© 2008 Optical Society of America
Original Manuscript: March 27, 2008
Revised Manuscript: May 28, 2008
Published: August 6, 2008
Vol. 3, Iss. 10 Virtual Journal for Biomedical Optics
Vincent Poher, Gordon T. Kennedy, Hugh B. Manning, Dylan M. Owen, Haoxiang X. Zhang, Erdan Gu, Martin D. Dawson, Paul M. W. French, and Mark A. A. Neil, "Improved sectioning in a slit scanning confocal microscope," Opt. Lett. 33, 1813-1815 (2008)