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Optics Letters

Optics Letters


  • Editor: Alan E. Willner
  • Vol. 33, Iss. 19 — Oct. 1, 2008
  • pp: 2272–2274

Optical coherence refractometry

Peter H. Tomlins, Peter Woolliams, Christian Hart, Andrew Beaumont, and Matthew Tedaldi  »View Author Affiliations

Optics Letters, Vol. 33, Issue 19, pp. 2272-2274 (2008)

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We introduce a novel approach to refractometry using a low coherence interferometer at multiple angles of incidence. We show that for plane parallel samples it is possible to measure their phase refractive index rather than the group index that is usually measured by interferometric methods. This is a significant development because it enables bulk refractive index measurement of scattering and soft samples, not relying on surface measurements that can be prone to error. Our technique is also noncontact and compatible with in situ refractive index measurements. Here, we demonstrate this new technique on a pure silica test piece and a highly scattering resin slab, comparing the results with standard critical angle refractometry.

OCIS Codes
(110.4500) Imaging systems : Optical coherence tomography
(120.5710) Instrumentation, measurement, and metrology : Refraction

ToC Category:
Imaging Systems

Original Manuscript: August 5, 2008
Manuscript Accepted: August 26, 2008
Published: September 30, 2008

Virtual Issues
Vol. 3, Iss. 12 Virtual Journal for Biomedical Optics

Peter H. Tomlins, Peter Woolliams, Christian Hart, Andrew Beaumont, and Matthew Tedaldi, "Optical coherence refractometry," Opt. Lett. 33, 2272-2274 (2008)

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