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Optics Letters

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  • Editor: Alan E. Willner
  • Vol. 33, Iss. 21 — Nov. 1, 2008
  • pp: 2428–2430

Properties of high-numerical-aperture Mueller-matrix polarimeters

P. R.T. Munro and P. Török  »View Author Affiliations


Optics Letters, Vol. 33, Issue 21, pp. 2428-2430 (2008)
http://dx.doi.org/10.1364/OL.33.002428


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Abstract

To our knowledge there has been very little work done to establish the theoretical basis of high-NA Mueller matrix polarimetry. We consider how high-NA polarimetry differs from traditional wide-field polarimetry. We show that confocal polarimetry leads to an averaging of the sample Jones matrices, each of which is associated with one of the incident plane waves comprising the incident focused field and that a conventional polarimeter leads to an averaging of sample Mueller matrices. We conclude with an example.

© 2008 Optical Society of America

OCIS Codes
(110.0180) Imaging systems : Microscopy
(170.1790) Medical optics and biotechnology : Confocal microscopy
(260.2130) Physical optics : Ellipsometry and polarimetry
(110.5405) Imaging systems : Polarimetric imaging

ToC Category:
Imaging Systems

History
Original Manuscript: July 25, 2008
Revised Manuscript: September 4, 2008
Manuscript Accepted: September 8, 2008
Published: October 21, 2008

Virtual Issues
Vol. 4, Iss. 1 Virtual Journal for Biomedical Optics

Citation
P. R. T. Munro and P. Török, "Properties of high-numerical-aperture Mueller-matrix polarimeters," Opt. Lett. 33, 2428-2430 (2008)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-33-21-2428


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References

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