Fast f-to-2f interferometer for a direct measurement of the carrier-envelope phase drift of ultrashort amplified laser pulses
Optics Letters, Vol. 33, Issue 21, pp. 2545-2547 (2008)
http://dx.doi.org/10.1364/OL.33.002545
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Abstract
We propose a novel method to directly extract the phase from spectral interferograms, without the need for digital signal processing. This method is demonstrated with single-shot measurement and stabilization of the carrier-envelope phase of a
© 2008 Optical Society of America
OCIS Codes
(140.3280) Lasers and laser optics : Laser amplifiers
(140.7090) Lasers and laser optics : Ultrafast lasers
(320.7090) Ultrafast optics : Ultrafast lasers
(320.7160) Ultrafast optics : Ultrafast technology
ToC Category:
Ultrafast Optics
History
Original Manuscript: August 26, 2008
Manuscript Accepted: September 15, 2008
Published: October 29, 2008
Citation
Sebastian Koke, Christian Grebing, Bastian Manschwetus, and Günter Steinmeyer, "Fast f-to-2f interferometer for a direct measurement of the carrier-envelope phase drift of ultrashort amplified laser pulses," Opt. Lett. 33, 2545-2547 (2008)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-33-21-2545
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