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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Alan E. Willner
  • Vol. 33, Iss. 21 — Nov. 1, 2008
  • pp: 2568–2570

Subwavelength imaging opportunities with planar uniaxial anisotropic lenses

Huikan Liu, Shivanand, and Kevin J. Webb  »View Author Affiliations


Optics Letters, Vol. 33, Issue 21, pp. 2568-2570 (2008)
http://dx.doi.org/10.1364/OL.33.002568


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Abstract

The imaging properties of a uniaxial anisotropic slab lens, where the dielectric tensor components are of the opposite sign, are studied as a function of the structure parameters. While hypothetical parameters yield various levels of performance, a design principle to achieve good subwavelength resolution is suggested. The anisotropy can be implemented with a metal-insulator stack.

© 2008 Optical Society of America

OCIS Codes
(110.2990) Imaging systems : Image formation theory
(160.1190) Materials : Anisotropic optical materials
(260.3910) Physical optics : Metal optics
(310.6860) Thin films : Thin films, optical properties
(310.6628) Thin films : Subwavelength structures, nanostructures

ToC Category:
Imaging Systems

History
Original Manuscript: June 12, 2008
Manuscript Accepted: August 15, 2008
Published: October 31, 2008

Citation
Huikan Liu, Shivanand, and Kevin J. Webb, "Subwavelength imaging opportunities with planar uniaxial anisotropic lenses," Opt. Lett. 33, 2568-2570 (2008)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-33-21-2568

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