Measurement of nanoparticle sizes by conventional optical microscopy with standing evanescent field illumination
Optics Letters, Vol. 33, Issue 23, pp. 2794-2796 (2008)
http://dx.doi.org/10.1364/OL.33.002794
Enhanced HTML 
Acrobat PDF (209 KB)
Abstract
The size of a particle smaller than the diffraction limit is measured using a conventional optical microscope by adopting a standing evanescent field illumination. The scattering intensity from a nanoparticle is periodically modulated by shifting the intensity fringes of the standing evanescent field. By measuring contrast of scattering intensity variation during one cycle of modulation, particle sizes can be estimated easily. Furthermore, material dependence can be canceled using contrast as an evaluation factor. From the experimental results, particle sizes ranging from
© 2008 Optical Society of America
OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.4630) Instrumentation, measurement, and metrology : Optical inspection
(120.5060) Instrumentation, measurement, and metrology : Phase modulation
(290.5850) Scattering : Scattering, particles
ToC Category:
Scattering
History
Original Manuscript: July 28, 2008
Revised Manuscript: September 25, 2008
Manuscript Accepted: October 19, 2008
Published: November 21, 2008
Virtual Issues
Vol. 4, Iss. 2 Virtual Journal for Biomedical Optics
Citation
Xiang Yu, Yukihiro Araki, Kentaro Iwami, and Norihiro Umeda, "Measurement of nanoparticle sizes by conventional optical microscopy with standing evanescent field illumination," Opt. Lett. 33, 2794-2796 (2008)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-33-23-2794
You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
Related Journal Articles 
- Measurement of the chromatic dispersion of an optical fiber by use of a Sagnac interferometer employing asymmetric modulation (OL)
- Geometrical cross-sectional imaging by a heterodyne wavelength-scanning interference confocal microscope (OL)
- Method for analyzing multiple-mirror coupled optical systems (JOSAA)
- Analysis of fringe locking in a laser diode interferometer under injection-current modulation (OL)
- Polarized light-scattering measurements of dielectric spheres upon a silicon surface (OL)
Related Conference Papers
- Seeing inside chips and cells: High-resolution subsurface imaging of integrated circuits, quantum dots and subcellular structures
- Testing of aspheric wavefronts
- Real-Time Phase-Free and Background-Free Detection of Nanoparticles and Viruses
- Measurement of Solder Ball Height and Shape Defects Using a Visible Supercontinuum Based Line Scan Interferometer
- Measurement of Solder Ball Height and Shape Defects Using a Visible Supercontinuum Based Line Scan Interferometer
« Previous Article | Next Article »
OSA is a member of 