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Optics Letters

Optics Letters


  • Editor: Alan E. Willner
  • Vol. 33, Iss. 23 — Dec. 1, 2008
  • pp: 2809–2811

Spectral phase measurements for broad Raman sidebands by using spectral interferometry

Takayuki Suzuki, Naoki Sawayama, and Masayuki Katsuragawa  »View Author Affiliations

Optics Letters, Vol. 33, Issue 23, pp. 2809-2811 (2008)

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We report a method of spectral phase measurement for a femtosecond pulse train composed of a discrete Raman spectrum. The method is based on an idea of spectral interference. Making use of a small portion of two Raman pump laser radiations, we produce two sum-frequency spectra that spectrally interfere with each other. Based on this interfering sum-frequency spectra, we successfully derive the spectral phase and reconstruct the temporal profile. The reliability of this method is also confirmed by measuring the spectral phase changes caused by intentionally inserted silica plates of various thicknesses and comparing them to theoretical predictions.

© 2008 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(190.5650) Nonlinear optics : Raman effect
(320.5520) Ultrafast optics : Pulse compression
(320.7160) Ultrafast optics : Ultrafast technology
(190.4223) Nonlinear optics : Nonlinear wave mixing

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: August 25, 2008
Revised Manuscript: October 22, 2008
Manuscript Accepted: October 24, 2008
Published: November 24, 2008

Takayuki Suzuki, Naoki Sawayama, and Masayuki Katsuragawa, "Spectral phase measurements for broad Raman sidebands by using spectral interferometry," Opt. Lett. 33, 2809-2811 (2008)

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