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Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Alan E. Willner
  • Vol. 33, Iss. 23 — Dec. 1, 2008
  • pp: 2827–2829

Improved focused ion beam fabrication of near-field apertures using a silicon nitride membrane

J. Brian Leen, Paul Hansen, Yao-Te Cheng, and Lambertus Hesselink  »View Author Affiliations


Optics Letters, Vol. 33, Issue 23, pp. 2827-2829 (2008)
http://dx.doi.org/10.1364/OL.33.002827


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Abstract

We report an improved fabrication method for C-shaped near-field apertures resonant in the near-IR regime. The apertures are created in a metal layer on a silicon nitride membrane using a focused ion beam and a through membrane milling technique that avoids two problems with fabricating very small apertures: gallium contamination and edge rounding. Finite-difference time-domain simulations predict a 63 × more intense near field with a 2.2 × smaller spot versus conventionally milled apertures. We verify the position of the simulated resonance peaks with experimental far-field transmission measurements where we also find an increase of 8.8 × in intensity. Our method has applications to many other plasmonic devices including bow-tie and fractal apertures, periodic arrays, and gratings.

© 2008 Optical Society of America

OCIS Codes
(050.1220) Diffraction and gratings : Apertures
(220.4241) Optical design and fabrication : Nanostructure fabrication
(050.6624) Diffraction and gratings : Subwavelength structures

ToC Category:
Diffraction and Gratings

History
Original Manuscript: September 15, 2008
Manuscript Accepted: October 2, 2008
Published: November 24, 2008

Citation
J. Brian Leen, Paul Hansen, Yao-Te Cheng, and Lambertus Hesselink, "Improved focused ion beam fabrication of near-field apertures using a silicon nitride membrane," Opt. Lett. 33, 2827-2829 (2008)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-33-23-2827


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