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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Alan E. Willner
  • Vol. 33, Iss. 23 — Dec. 1, 2008
  • pp: 2855–2857

Direct measurement of group delay with joint time–frequency analysis of a white-light spectral interferogram

Yuqiang Deng, Weijian Yang, Chun Zhou, Xi Wang, Jun Tao, Weipeng Kong, and Zhigang Zhang  »View Author Affiliations


Optics Letters, Vol. 33, Issue 23, pp. 2855-2857 (2008)
http://dx.doi.org/10.1364/OL.33.002855


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Abstract

We propose and demonstrate an analysis method to directly extract the group delay rather than the phase from the white-light spectral interferogram. By the joint time–frequency analysis technique, group delay is directly read from the ridge of wavelet transform, and group-delay dispersion is easily obtained by additional differentiation. The technique shows reasonable potential for the characterization of ultra-broadband chirped mirrors.

© 2008 Optical Society of America

OCIS Codes
(100.7410) Image processing : Wavelets
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(260.2030) Physical optics : Dispersion

ToC Category:
Ultrafast Optics

History
Original Manuscript: August 11, 2008
Revised Manuscript: October 9, 2008
Manuscript Accepted: October 13, 2008
Published: November 25, 2008

Citation
Yuqiang Deng, Weijian Yang, Chun Zhou, Xi Wang, Jun Tao, Weipeng Kong, and Zhigang Zhang, "Direct measurement of group delay with joint time-frequency analysis of a white-light spectral interferogram," Opt. Lett. 33, 2855-2857 (2008)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-33-23-2855

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