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Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Alan E. Willner
  • Vol. 33, Iss. 3 — Feb. 1, 2008
  • pp: 204–206

Surface waves between metallic films and truncated photonic crystals observed with reflectance spectroscopy

B. J. Lee, Y.-B. Chen, and Z. M. Zhang  »View Author Affiliations


Optics Letters, Vol. 33, Issue 3, pp. 204-206 (2008)
http://dx.doi.org/10.1364/OL.33.000204


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Abstract

We have analyzed and demonstrated surface-wave excitations, by propagating waves in air, at the interface between a truncated photonic crystal (PC) and a silver film in the near-infrared. The truncated PC was fabricated with several unit cells of alternating Si O 2 and Si 3 N 4 layers. The dispersion relation of surface waves was calculated using the supercell method. A Fourier-transform infrared spectrometer measured the spectral reflectance of the fabricated sample at different incidence angles. An angle-resolved laser scatterometer measured the reflectance as a function of the incidence angle at the wavelength of 891 nm . The agreement between the resonance conditions obtained from experiments and the calculated dispersion relation manifests that surface waves at the PC–Ag interface may be utilized to build coherent thermal-emission sources.

© 2008 Optical Society of America

OCIS Codes
(240.6690) Optics at surfaces : Surface waves
(310.6860) Thin films : Thin films, optical properties

ToC Category:
Optics at Surfaces

History
Original Manuscript: October 22, 2007
Manuscript Accepted: December 5, 2007
Published: January 15, 2008

Citation
B. J. Lee, Y.-B. Chen, and Z. M. Zhang, "Surface waves between metallic films and truncated photonic crystals observed with reflectance spectroscopy," Opt. Lett. 33, 204-206 (2008)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-33-3-204


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