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Optics Letters

Optics Letters


  • Editor: Alan E. Willner
  • Vol. 33, Iss. 3 — Feb. 1, 2008
  • pp: 255–257

Subdiffraction resolution in total internal reflection fluorescence microscopy with a grating substrate

Anne Sentenac, Kamal Belkebir, Hugues Giovannini, and Patrick C. Chaumet  »View Author Affiliations

Optics Letters, Vol. 33, Issue 3, pp. 255-257 (2008)

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We propose a fluorescence surface imaging system that presents a power of resolution beyond that of the diffraction limit without resorting to saturation effects or probe scanning. This is achieved by depositing the sample on an optimized periodically nanostructured substrate in a standard total internal reflection fluorescence microscope. The grating generates a high-spatial-frequency light grid that can be moved throughout the sample by changing the incident angle. An appropriate reconstruction procedure permits one to recover the fluorescence amplitude from the images obtained for various incidences. Simulations of this imaging system show that the resolution is not limited by diffraction but by the period of the grating.

© 2008 Optical Society of America

OCIS Codes
(050.2770) Diffraction and gratings : Gratings
(110.0180) Imaging systems : Microscopy
(240.6680) Optics at surfaces : Surface plasmons

ToC Category:
Diffraction and Gratings

Original Manuscript: July 3, 2007
Revised Manuscript: December 11, 2007
Manuscript Accepted: December 13, 2007
Published: January 29, 2008

Virtual Issues
Vol. 3, Iss. 3 Virtual Journal for Biomedical Optics

Anne Sentenac, Kamal Belkebir, Hugues Giovannini, and Patrick C. Chaumet, "Subdiffraction resolution in total internal reflection fluorescence microscopy with a grating substrate," Opt. Lett. 33, 255-257 (2008)

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