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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Alan E. Willner
  • Vol. 33, Iss. 4 — Feb. 15, 2008
  • pp: 333–335

Modeling of a nanoscale rectangular hole in a real metal

Arun Kumar and Triranjita Srivastava  »View Author Affiliations


Optics Letters, Vol. 33, Issue 4, pp. 333-335 (2008)
http://dx.doi.org/10.1364/OL.33.000333


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Abstract

We propose and implement a simple and accurate method to analyze a subwavelength rectangular hole in a real metal and obtain the modal characteristics of its fundamental mode. Our results are found to be in excellent agreement with those reported in the literature, obtained by the effective index method (EIM) and finite-element and finite-difference methods. Unlike the EIM, the present method has no ambiguity in its implementation and is able to predict the major field components also, which may be useful in understanding the extraordinary transmission characteristics of such structures.

© 2008 Optical Society of America

OCIS Codes
(230.7370) Optical devices : Waveguides
(240.6680) Optics at surfaces : Surface plasmons
(250.5403) Optoelectronics : Plasmonics

ToC Category:
Optoelectronics

History
Original Manuscript: October 19, 2007
Revised Manuscript: December 21, 2007
Manuscript Accepted: January 9, 2008
Published: February 11, 2008

Citation
Arun Kumar and Triranjita Srivastava, "Modeling of a nanoscale rectangular hole in a real metal," Opt. Lett. 33, 333-335 (2008)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-33-4-333

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